Chemistry and Orientation with NEXAFS Spectroscopy
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Introduction
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Organic electronic devices involve several critical interfaces
between disparate materials
Properties of these interfaces dominate performance.
NEXAFS provides chemistry and orientation information to
develop meaningful correlations between materials, processing,
electronic properties, and ultimate performance.
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| The organic field-effect transistor (OFET)
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Near Edge X-ray Absorption Fine Structure Spectroscopy (NEXAFS)
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 Daniel
Fischer, Sharadha Sambasivan (Ceramics Division, MSEL) NIST-Dow
Beamline U7A, Brookhaven National Laboratory
Elemental absorption of soft X-ray radiation
Promotes K-shell electrons to unoccupied C, N, O, and F
molecular orbitals
Polarization allows orientation-dependent thickness profiling
Nondestructive and automated
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| Chemistry |
Molecular orientation |
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Results
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| Soluble pentacene precursor |
New Material Concept
“Soluble” pentacene to allow ink-jet printing
of device
Challenge
Interpreting device performance variations with conversion
temperature.
NEXAFS
Identifies performance tradeoff between increased molecular
order and defects
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Surface Coverage
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Orientation Development
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Full Correlation: processing --> structure
and chemistry --> performance
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NIST Contributors
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Dean DeLongchamp*
Daniel Fischer
Sharadha Sambasivan
Eric Lin
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Collaborators:
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Amanda R. Murphy, Jean M. J. Fréchet,
Paul Chang, Steven Volkman, Vivek Subramanian
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