Small Angle X-ray Scattering (SAXS) is a powerful
non-destructive technique to probe the structure of materials over length scales of
(1 to 100) nm. The SAXS facility in the Division is unique with several
configurations available through two target sources, a Bonse-Hart camera, and a
pinhole geometry. The Molybdenum target allows SAXS measurements of thin films on
silicon films enabling a wide range of thin film structural measurements.