NCMC-2:  Adhesion and Mechanical Properties Presentation Slides

bullet icon  Welcome and Introductions

Dr. Alamgir Karim, NIST

bullet icon  Recent Advances in Adhesion Studies using Contact Mechanics

Dr. Manoj Chaudhury, Lehigh University
bullet icon  Materials Issues and Adhesion Impact on Reliability of Cu/low k Interconnects
Dr. Paul Ho, University of Texas at Austin
bullet icon  Presentation of NIST Service Life Prediction Facilities
Dr. Christopher White, NIST
bullet icon  Multilens Contact Adhesion Test Method (MCAT)
Dr. Alfred Crosby, University of Massachusetts at Amherst
bullet icon  Combinatorial Adhesion Test Examples
Dr. Christopher Stafford, NIST
bullet icon  Combinatorial Edge-Delamination Test for Thin Film Adhesion
Dr. Martin Chiang, NIST
bullet icon  Combinatorial Peel Test Method for Adhesion
Dr. Rui Song, NIST
bullet icon  Poster Session-General Combi Methods
Dr. Michael Fasolka, Organizer
bullet icon  Overview on Polymer Craze and Fracture using the Copper Grid Technique
Dr. Chang Ryu, Rensselaer Polytechnic Institute
bullet icon  Combinatorial Measurements of Polymer Craze Growth using the Copper Grid Test Method
Dr. Kathryn Beers, NIST
bullet icon  A High-Throughput Test Method for Mechanical Properties of Thin Films
Dr. Christoper Harrison, NIST
bullet icon NCMC Practical Knowledge Toolkit
Dr. Michael Fasolka, NIST
bullet icon  Panel Discussion:  Future Members Needs
Dr. Eric Amis, NIST
Dr. Kapeeleshwar Krishana, Rhodia, Inc.
(Please be patient, files are large and will take time to load)
 
 **Certain commercial equipment, instruments, materials, services, or companies are identified in this paper in order to specify adequately the experimental procedure.  This in no way implies endorsement or recommendation by NIST.  In addition, NIST is not liable for the accuracy of the results from experiments not conducted at NIST.
 
NIST Materials Science & Engineering Laboratory - Polymers Division

Contact Information:

Carol E. Laumeier, M.B.A.

Outreach Coordinator

combi@nist.gov

301-975-6093

  Last updated: June 6, 2006
Contact: combi@nist.gov